Header Bild

Lehrstuhl für Gießereikunde


Technical Data:

Dual Beam SEM (FEI) Scanning Electron Microscopy

Focussed Ion Beam (FIB)
(in collaboration with Dept. Metallurgy)


Microstructure analysis and sample preparation for TEM


TEM sample preparation


Automatic Twin-Jet Electropolisher (Fischione instrument)

Technical Data:

Model 110 Twin-Jet Electropolisher

  • Electrolytic polishing or chemical etching
  • Simultaneous two-sided polishing
  • Fast
  • No induced artifacts
  • Easily adjustable flow rate, jet and specimen positions
  • Reliable, accurate termination

The Model 130 Specimen Punch prepares high-quality disk specimens. 
The Model 220 Low Temp Container allows the Electropolisher to be used at cryogenic temperatures.


High-quality thin foils for TEM



TEM sample preparation


Gatan 691 Precision Ion Polishing System (PIPS™)

Technical Data:

High milling rates at shallow angles to less than 1 degree

Penning guns having no consumable parts

Whisperlok™ for fast and simple specimen exchange

Patented specimen holders for double sided, low angle milling

Beam Modulation offering both single and double sector milling

CCD imagery for "real-time" video monitors imaging


The PIPS™ is a user-friendly precision ion polisher designed to produce high quality, TEM specimens with minimal effort.




CM12 and JEOL-2100F

(in collaboration with ESI)

For more information, please link to CM12 and JEOL-2100F in ESI.