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Lehrstuhl für Gießereikunde

SEM

Technical Data:

Dual Beam SEM (FEI) Scanning Electron Microscopy


Focussed Ion Beam (FIB)
(in collaboration with Dept. Metallurgy)

Application:

Microstructure analysis and sample preparation for TEM

 

TEM sample preparation

 

Automatic Twin-Jet Electropolisher (Fischione instrument)

Technical Data:

Model 110 Twin-Jet Electropolisher

  • Electrolytic polishing or chemical etching
  • Simultaneous two-sided polishing
  • Fast
  • No induced artifacts
  • Easily adjustable flow rate, jet and specimen positions
  • Reliable, accurate termination

Accessories 
The Model 130 Specimen Punch prepares high-quality disk specimens. 
The Model 220 Low Temp Container allows the Electropolisher to be used at cryogenic temperatures.

Application:

High-quality thin foils for TEM

 

 

TEM sample preparation

 

Gatan 691 Precision Ion Polishing System (PIPS™)

Technical Data:

High milling rates at shallow angles to less than 1 degree

Penning guns having no consumable parts

Whisperlok™ for fast and simple specimen exchange

Patented specimen holders for double sided, low angle milling

Beam Modulation offering both single and double sector milling

CCD imagery for "real-time" video monitors imaging

Application:

The PIPS™ is a user-friendly precision ion polisher designed to produce high quality, TEM specimens with minimal effort.

 

TEM

 

CM12 and JEOL-2100F

(in collaboration with ESI)

For more information, please link to CM12 and JEOL-2100F in ESI.